U1BC44,u1gc44,u1jc44 2006-11-06 1 toshiba rectifier silicon diffused junction type U1BC44, u1gc44, u1jc44 for hybrid use z average forward current : i f (av) = 1.0 a z repetitive peak reverse voltage : v rrm = 100 v, 400 v, 600 v z mini plastic mold package absolute maximum ratings (ta = 25c) characteristic symbol rating unit U1BC44 100 u1gc44 400 repetitive peak reverse voltage u1jc44 v rrm 600 v on ceramic substrate 1.0 (ta = 75c) average forward current on glass ? epoxy substrate i f (av) 0.9 (ta = 25c) a 30 (50hz) peak one cycle surge forward current (non ? repetitive) i fsm 33 (60hz) a junction temperature t j ? 40~150 c storage temperature range t stg ? 40~150 c note: using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant chang e in temperature, etc.) may cause this product to decrease in the reliability significantly ev en if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. please design the appropriate reliability upon reviewing the toshiba semiconductor reliability handbook (?handling precautions?/derating concept and methods) and indi vidual reliability data (i.e. reliability test report and estimated failure rate, etc). electrical characteristics (ta = 25c) characteristic symbol test condition min typ. max unit peak forward voltage v fm i fm = 1.0a D D 1.2 v repetitive peak reverse current i rrm v rrm = rated D D 10 a on ceramic substrate D D 60 thermal resistance r th (j ? a) dc on glass-epoxy substrate D D 120 c / w marking abbreviation code part no. bc U1BC44 gc u1gc44 jc u1jc44 jedec D jeita D toshiba 3 ? 4d1a weight: 0.06g unit: mm
U1BC44,u1gc44,u1jc44 2006-11-06 2 standard soldering pad handling precaution the absolute maximum ratings denote the absolute maximu m ratings, which are rated values and must not be exceeded during operation, even for an instant. the following are the genera l derating methods that we recommend when you design a circuit with a device. v rrm : we recommend that the worst case voltage, includ ing surge voltage, be no greater than 80% of the absolute maximum rating of v rrm for a dc circuit and be no greater than 50% of that of v rrm for an ac circuit. v rrm has a temperature coefficient of 0.1%/c. take this temperature coefficient into account designing a device at low temperature. i f(av) : we recommend that the worst case current be no greater than 80% of the absolute maximum rating of i f(av) . carry out adequate heat design. if you can?t design a circuit with excellent heat radiation, set the margin by using an allowable tamax-i f(av) curve. this rating specifies the non-repetitive peak current in one cycle of a 50-hz sine wave, condition angle 180. therefore, this is only applied for an abnormal operation, which seldom occu rs during the lifespan of the device. we recommend that a device be used at a tj of below 120c under the worst load and heat radiation conditions. thermal resistance between junction and ambient fluctuat es depending on the device?s mounting condition. when using a device, design a circuit board and a soldering land size to match the appropriate thermal resistance value. please refer to the rectifiers databook for further information.
U1BC44,u1gc44,u1jc44 2006-11-06 3
U1BC44,u1gc44,u1jc44 2006-11-06 4 restrictions on product use 20070701-en ? the information contained herein is subject to change without notice. ? toshiba is continually working to improve the quality and reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity an d vulnerability to physical stress. it is the responsibility of the buyer, when utilizing toshiba produc ts, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury or damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshib a products specifications. also, please keep in mind the precautions and conditions set forth in the ?handling guide for semiconduct or devices,? or ?toshiba semiconductor reliability handbook? etc. ? the toshiba products listed in this document are in tended for usage in general electronics applications (computer, personal equipment, office equipment, measuri ng equipment, industrial robotics, domestic appliances, etc.).these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfuncti on or failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage incl ude atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, et c.. unintended usage of toshiba products listed in his document shall be made at the customer?s own risk. ? the products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. ? the information contained herein is presented only as a guide for the applications of our products. no responsibility is assumed by toshiba for any infringement s of patents or other rights of the third parties which may result from its use. no license is granted by implic ation or otherwise under any patents or other rights of toshiba or the third parties. ? please contact your sales representative for product- by-product details in this document regarding rohs compatibility. please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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